32Ch Isolated Output Card
Isolated digital input interface for SLSC
The SET-1320 device is an isolated digital output interface for NI-SLSC.
This card provides 32 optically isolated open-collector outputs that can switch up to 100 mA at 60 V DC. SET-1320 combines high-density IO with high isolation voltages and a wide output voltage range. It allows to break ground loops and protect susceptible test equipment from DUTs. It also enables to interface standard logic-level test equipment with almost any system voltage. The SET-1320 can be driven through the RTI or through the SLSC chassis via software. RTI inputs are compatible with LVTTL and TTL logic levels.
The SET-1320 has 32 optically isolated open-collector outputs. Current can flow from CH+ to CH- when the output is on. The outputs are reverse polarity protected to -60 V DC. The outputs are controlled from a logic-level digital output source, like NI R-Series FPGA or NI C-Series digital output modules, through the RTI.
- Galvanic channel to channel and rack isolation
- Large input voltage range – 0 to 60V
- 32 optically isolated digital inputs
- Isolation voltage:
- 70 VRMS
- 100 VDC
- Wide input voltage range
- Input current limited to 6mA over entire input voltage range
- Input reverse protection up to -60V
Absolute Maximum Ratings
|Max. Output Channel Voltage||Measured between CH+ and CH-||60 V DC|
|Max. Channel Reverse Voltage||Measured between CH+ and CH-||-60 V DC|
|Channel to Channel||120 V DC||If pins are not adjacent to each other.|
Otherwise 60 V DC.
|Channels to Chassis||60 V DC|
Technical Data Front Interface
|Max Output Switching Frequency||1 kΩ Pull up @ 5 V DC||50 kHz||Depending on Pull up Current|
|Max. Current||100 mA||Peak: 500 mA|
|Max. Output Forward Voltage||I = 100 mA||< 1.3 V DC|
Technical Data Rear Interface
|Max. Input Channel Voltage||Relative to DGND||5.5 V|
|10% to 90%|
|5% to 95%|
|Module Operating Temperature||Forced-air cooling from chassis||0 °C to 75 °C|
|Storage Temperature||-40 °C to 85 °C|
|Maximum Altitude||2000 m|
- 32 isolated inputs
- Enables DUT characterization required in parametric testing
- Isolation of computer from field devices
- Breaking ground loops
- High sensitivity current digital input
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