HTRB test systems
Low TCOT at high quality and throughput
Our HTRB & H3TRB systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform.
System’s specific features
- Fewer climate chambers due to high number of DUTs tested simultaneously
- No test interruptions due to defective DUTs
- High throughput for each system
- Several different tests possible within one test run
- Complete logging of all devices under test during the complete test phase
- Fully automated test process
- Automated test continuation according to characterization
- Freely programmable test system based on National Instruments’ COTS platform
- Integrated safety system
Technical Data
HTRB Type 1 | HTRB Type 2 | H3TRB | |
| Devices under test (DUTs) per system (fully monitored) | 240 | 120 | 120 |
| Adjustable test temperature | 50 up to 250°C | 50 up to 250°C | climate chamber |
| Reverse voltage | 50 up to 600V | 50 up to 2000V | 50 up to 2000V |
| Current measurement per DUT | 1mA / 10mA / 20mA | 1mA / 10mA / 20mA | 1mA / 10mA / 20mA |
| Current monitoring per DUT | ✓ | ✓ | ✓ |
| Single DUT control | ✓ | ✓ | ✓ |
| Number of controllable power sources | 1 up to 6 | 1 up to 6 | 1 up to 6 |
| Safety system | ✓ | ✓ | ✓ |
| SQL Database adapter | ✓ | ✓ | ✓ |
