HTRB test systems

 

Low TCOT at high quality and throughput

Our HTRB & H3TRB systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform.

 

System’s specific features

  • Fewer climate chambers due to high number of DUTs tested simultaneously
  • No test interruptions due to defective DUTs
  • High throughput for each system
  • Several different tests possible within one test run
  • Complete logging of all devices under test during the complete test phase
  • Fully automated test process
  • Automated test continuation according to characterization
  • Freely programmable test system based on National Instruments’ COTS platform
  • Integrated safety system
SET's HTRB Testsystem

Technical Data

HTRB Type 1

HTRB Type 2

H3TRB

Devices under test (DUTs) per system (fully monitored)

240

120

120

Adjustable test temperature

50 up to 250°C

50 up to 250°C

climate chamber

Reverse voltage

50 up to 600V

50 up to 2000V

50 up to 2000V

Current measurement
per DUT

1mA / 10mA / 20mA

1mA / 10mA / 20mA

1mA / 10mA / 20mA

Current monitoring per DUT

Single DUT control

Number of controllable power sources

1 up to 6

1 up to 6

1 up to 6

Safety system

SQL Database adapter