IOL & Power Cycling test systems
Low Total Cost of Test (TCOT)
with high quality and high throughput
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
System features
- Fully automated test process including characterization
- High throughput due to active cooling
- Full recording of all single pulses of each DUT
- High-precision timing through FPGA technology
- Compatible with new wide bandgap technology (SiC / GaN)
Technical Data
IOL 80 | IOL mini Lab | IOL Bench Top | Power Cycling | |
Devices under test (DUT‘S) per system (fully monitored) | 80 max | 32 max | 16 max | 3×3 max |
Load current | 0-250A | 0-250A | 0-250A | 0-2000A |
Measurement current | -50 – +50mA | -50 – +50mA | -50 – +50mA | -50 – +50mA |
Active cooling | ✓ | ✓ | ✓ | ✓ |
Cooling medium | Air / Gas | Air / Gas | Air / Gas | Liquid conditioning -40°C – +150°C |
Monitoring parameter | ✓ | ✓ | ✓ | ✓ |
FPGA-Technology for precise timing and measurement | ✓ | ✓ | ✓ | ✓ |
RT based measurement engine | ✓ | ✓ | ✓ | ✓ |
Online visualisation | ✓ | ✓ | ✓ | ✓ |
DIAdem data connector for offline analysis | ✓ | ✓ | ✓ | ✓ |
Modularity | 1-5 Modules | 1-2 Modules | 1 Modul | 1-2 Modules |
