Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
- Fully automated test process including characterization
- High throughput due to active cooling
- Full recording of all single pulses of each DUT
- High-precision timing through FPGA technology
- Compatible with new wide bandgap technology (SiC / GaN)