{"id":316,"date":"2022-01-21T16:05:38","date_gmt":"2022-01-21T16:05:38","guid":{"rendered":"http:\/\/new.smart-e-tech.de\/semiconductor\/dynamic-h3trb-drb-testing\/"},"modified":"2024-04-10T11:11:09","modified_gmt":"2024-04-10T09:11:09","slug":"dynamic-h3trb-drb-testing","status":"publish","type":"page","link":"https:\/\/www.smart-e-tech.de\/en\/semiconductor\/dynamic-h3trb-drb-testing\/","title":{"rendered":"Dynamic H3TRB \/ AC-HTC \/ DRB test systems"},"content":{"rendered":"\n<p><\/p>\n\n\n\n<p><\/p>\n\n\n<div class=\"lazyblock-content-section-Zz1vFM bg-green wp-block-lazyblock-content-section\">\n\n<section class=\"mt-0 mb-0\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\" green-gradient p-0\">\n                    \n<div class=\"wp-bootstrap-blocks-row row pt-5 pb-5\">\n\t\n\n<div class=\"col-12 col-lg-6 pt-5\">\n\t\t\t\n\n<h1 class=\"wp-block-heading\" id=\"dynamische-h3trb-drb-testsysteme\"><strong><strong>Dynamic H3TRB \/ AC-HTC \/<\/strong><\/strong> <strong><strong>DRB test systems<\/strong><\/strong><\/h1>\n\n\n\n<h2 class=\"wp-block-heading\" id=\"innovative-zuverlassigkeitstests-fur-sic-und-gan-halbleiter\" style=\"font-style:normal;font-weight:400\">Innovative reliability tests for SiC and<strong> <\/strong>GaN semiconductors<\/h2>\n\n\n\n<p>Wide bandgap materials like silicon carbide (SiC) and gallium nitride (GaN) are dominating the future of power electronics. And it needs new and dynamic test procedures for their qualification and development. With test systems by SET, it is possible to conduct these tests automatically and for a high number of DUTs.<\/p>\n\n\t<\/div>\n\n\n\n<div class=\"col-12 col-lg-6\">\n\t\t\t\n\n<figure class=\"wp-block-image size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"919\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Dyn.-H3TRB-DRB-Testsysteme_Klimakammer_v2-1-1024x919.png\" alt=\"Dynamische H3TRB-DRB Testsysteme Klimakammer\" class=\"wp-image-5402\" srcset=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Dyn.-H3TRB-DRB-Testsysteme_Klimakammer_v2-1-1024x919.png 1024w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Dyn.-H3TRB-DRB-Testsysteme_Klimakammer_v2-1-300x269.png 300w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Dyn.-H3TRB-DRB-Testsysteme_Klimakammer_v2-1-768x690.png 768w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Dyn.-H3TRB-DRB-Testsysteme_Klimakammer_v2-1-600x539.png 600w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Dyn.-H3TRB-DRB-Testsysteme_Klimakammer_v2-1.png 1420w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\t<\/div>\n\n<\/div>\n\n                <\/div>\n            <\/div>\n          \n        <\/div>\n    <\/div><!-- \/container -->\n<\/section><!-- \/section --><\/div>\n\n<div class=\"lazyblock-breadcrumb-ZvoPMr wp-block-lazyblock-breadcrumb\"><div class=\"container\">\n    <div class=\"row\">\n        <div class=\"col\">\n            <nav class=\"breadcrumb mb-4 mt-2 small\"><a href=\"https:\/\/www.smart-e-tech.de\/en\/\">Start<\/a><span class=\"divider\">&nbsp;&rsaquo;&nbsp;<\/span><a href=\"https:\/\/www.smart-e-tech.de\/en\/company\/\">Company<\/a> <span class=\"divider\">&nbsp;&rsaquo;&nbsp;<\/span> News<\/nav>        <\/div>\n    <\/div>\n<\/div>\n<\/div>\n\n<div class=\"lazyblock-content-section-Z16VdjX wp-block-lazyblock-content-section\">\n\n<section class=\"mt-5 mb-5\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\"  p-0\">\n                    \n\n<h2 class=\"wp-block-heading\" id=\"sic-und-gan-halbleiter-fur-energieeffiziente-zukunftstechnologien\"><strong><strong>SiC and GaN semiconductors for energy efficient technologies of the future<\/strong><\/strong><\/h2>\n\n\n<div class=\"wp-bootstrap-blocks-row row\">\n\t\n\n<div class=\"col-12 col-lg-4 order-2 order-lg-1\">\n\t\t\t\n<div class=\"lazyblock-youtube-1u20VB wp-block-lazyblock-youtube\">\n\n\n                                <a class=\"videopreview \" href=\"#\" id=\"ytd4cd91e80f36f8f3103617ded9128560\" data-bs-toggle=\"modal\" data-bs-target=\"#modald4cd91e80f36f8f3103617ded9128560\">\n                <div class=\"ratio ratio-16x9\">\n                    \n                <div class=\"playbutton\"><i class=\"icon-play \"><\/i><\/div>\n                                          \n                      <img decoding=\"async\" class=\"ytpreview\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/02\/Dynamischer-HTGB-HTGS-1024x576.jpg\">\n                                    <\/div>\n                <\/a>\n\n                \n    \n\n<script>\n  \/\/jQuery(document).ready(function($) {\n\n jQuery(document).ready(function($) {\n\n   \/* Get iframe src attribute value i.e. YouTube video url\n    and store it in a variable *\/\n    var url = $(\"#videod4cd91e80f36f8f3103617ded9128560\").attr('src');\n    \n    \/* Remove iframe src attribute on page load to\n    prevent autoplay in background *\/\n    $(\"#videod4cd91e80f36f8f3103617ded9128560\").attr('src', '');\n    \n    \/* Assign the initially stored url back to the iframe src\n    attribute when modal is displayed *\/\n    $(\"#modald4cd91e80f36f8f3103617ded9128560\").on('shown.bs.modal', function(){\n        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          <div class=\"BorlabsCookie _brlbs-cb-youtube\"><div class=\"_brlbs-content-blocker\"> <div class=\"_brlbs-embed _brlbs-video-youtube\"> <img class=\"_brlbs-thumbnail\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/plugins\/borlabs-cookie\/assets\/images\/cb-no-thumbnail.png\" alt=\"YouTube\"> <div class=\"_brlbs-caption\"> <p>Mit dem Laden des Videos akzeptieren Sie die Datenschutzerkl\u00e4rung von YouTube.<br><a href=\"https:\/\/policies.google.com\/privacy\" target=\"_blank\" rel=\"nofollow noopener noreferrer\">Mehr erfahren<\/a><\/p> <p><a class=\"_brlbs-btn _brlbs-icon-play-white\" href=\"#\" data-borlabs-cookie-unblock role=\"button\">Video laden<\/a><\/p> <p><label><input type=\"checkbox\" name=\"unblockAll\" value=\"1\" checked> <small>YouTube immer entsperren<\/small><\/label><\/p> <\/div> <\/div> <\/div><div class=\"borlabs-hide\" data-borlabs-cookie-type=\"content-blocker\" data-borlabs-cookie-id=\"youtube\"><script type=\"text\/template\">PGlmcmFtZSBsb2FkaW5nPSJsYXp5IiBpZD0idmlkZW9kNGNkOTFlODBmMzZmOGYzMTAzNjE3ZGVkOTEyODU2MCIgY2xhc3M9ImVtYmVkLXJlc3BvbnNpdmUtaXRlbSIgd2lkdGg9IjEyMDAiIGhlaWdodD0iNjAwIiBzcmM9Imh0dHBzOi8vd3d3LnlvdXR1YmUtbm9jb29raWUuY29tL2VtYmVkL003QmU2S1RINUdrIiBhbGxvd2Z1bGxzY3JlZW4+PC9pZnJhbWU+<\/script><\/div><\/div>\n                    <\/div>\n                             \n      <\/div>\n    <\/div>\n    <\/div>\n  <\/div>\n<\/div>\n<\/div>\n\t<\/div>\n\n\n\n<div class=\"col-12 col-lg-8 order-1 order-lg-2\">\n\t\t\t\n\n<p>Increased requirements in terms of energy efficiency and a reduced environmental impact are determining factors for the development in power electronics and pave the way for wide bandgap materials like silicon carbide or gallium nitride. SiC and GaN power semiconductors deliver a much better power density when compared with classic silicon components. Their switching properties are extraordinary and with their high efficiency, they consume less power and can withstand higher temperatures. Consequently, they form a perfect basis for robust and greener future technologies, however, they come with fault mechanisms, which now need to be discovered through newly developed testing procedures. From a material specific perspective, the aim of these testing procedures is to verify the <strong>reliable performance<\/strong> in the long run via innovative tests. And this is exactly the approach we at SET take with our semiconductor test systems.<\/p>\n\n\t<\/div>\n\n<\/div>\n\n                <\/div>\n            <\/div>\n          \n        <\/div>\n    <\/div><!-- \/container -->\n<\/section><!-- \/section --><\/div>\n\n<div class=\"lazyblock-content-section-Z2gWihO wp-block-lazyblock-content-section\">\n\n<section class=\"mt-5 mb-5\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\"  p-0\">\n                    \n<div class=\"wp-bootstrap-blocks-row row\">\n\t\n\n<div class=\"col-12 col-lg-8\">\n\t\t\t\n<div class=\"lazyblock-accordion-Z27VUR1 wp-block-lazyblock-accordion\">\n<div class=\"accordion\" id=\"accordion-2126\">\n \n<!-- ACC Item-->\n     \n<div class=\"accordion-item\">\n <h3 class=\"accordion-header\" id=\"additional_elements-1\">\n   <button class=\"accordion-button collapsed\" type=\"button\" data-bs-toggle=\"collapse\" data-bs-target=\"#collapse-2126-1\" aria-expanded=\"false\" aria-controls=\"collapseadditional_elements-1\">\n   Dynamic adjustments to the H3TRB test for SiC and GaN semiconductors   <\/button>\n <\/h3>\n <div id=\"collapse-2126-1\" class=\"accordion-collapse collapse\" aria-labelledby=\"heading2126-1\" data-bs-parent=\"#accordion-2126\">\n   <div class=\"accordion-body\">\n   <p>When verifying silicon carbide and gallium nitride semiconductors, a supplementary testing procedure is needed to determine new fault mechanisms in a targeted way. In a setting with a constant temperature and humidity, the DUT is not exposed to a constant voltage, instead the test uses dynamic drain stimuli with high voltage peaks. The voltage shifts lead to fast changes of the magnetic field, which have an impact on corrosion. The procedure accelerates the deterioration of the DUT and possibly also the insulation materials.<\/p>\n     \n   <\/div>\n <\/div>\n<\/div>\n\n<!-- END ACC Item -->\n\n \n<!-- ACC Item-->\n     \n<div class=\"accordion-item\">\n <h3 class=\"accordion-header\" id=\"additional_elements-2\">\n   <button class=\"accordion-button collapsed\" type=\"button\" data-bs-toggle=\"collapse\" data-bs-target=\"#collapse-2126-2\" aria-expanded=\"false\" aria-controls=\"collapseadditional_elements-2\">\n   The well-known High Humidity, High Temperature Reverse Bias (H3TRB) Test   <\/button>\n <\/h3>\n <div id=\"collapse-2126-2\" class=\"accordion-collapse collapse\" aria-labelledby=\"heading2126-2\" data-bs-parent=\"#accordion-2126\">\n   <div class=\"accordion-body\">\n   <p>In its classic form, the High Humidity, High Temperature Reverse Bias (H3TRB) is a static test, in which the disintegration effects of humidity at an increased temperature on a discreet component or module is tested. In a climate chamber, the DUT is exposed to a temperature of 85\u00b0C (185\u00b0F) at 85% relative humidity. There is a very high block voltage of 80 to 100 % Umax and the runtime of the test is mostly 1000 h.<\/p>\n<p><span class=\"EOP SCXW51552343 BCX4\" data-ccp-props=\"{&quot;201341983&quot;:0,&quot;335559739&quot;:160,&quot;335559740&quot;:360}\">\u00a0<\/span><\/p>\n     \n   <\/div>\n <\/div>\n<\/div>\n\n<!-- END ACC Item -->\n\n \n<!-- ACC Item-->\n     \n<div class=\"accordion-item\">\n <h3 class=\"accordion-header\" id=\"additional_elements-3\">\n   <button class=\"accordion-button collapsed\" type=\"button\" data-bs-toggle=\"collapse\" data-bs-target=\"#collapse-2126-3\" aria-expanded=\"false\" aria-controls=\"collapseadditional_elements-3\">\n   Novel AC-HTC test to cover special application scenarios   <\/button>\n <\/h3>\n <div id=\"collapse-2126-3\" class=\"accordion-collapse collapse\" aria-labelledby=\"heading2126-3\" data-bs-parent=\"#accordion-2126\">\n   <div class=\"accordion-body\">\n   <p>The novel AC-HTC test adds additional temperature and humidity cycles to the dynamic stress. Among other things, condensation is also provoked on the test specimen. The test covers reliability requirements, e.g. for applications in the solar industry, which are not specifically tested by other tests.<\/p>\n     \n   <\/div>\n <\/div>\n<\/div>\n\n<!-- END ACC Item -->\n\n\n\n<\/div><\/div>\n\t<\/div>\n\n\n\n<div class=\"col-12 col-lg-4 pt-md-5\">\n\t\t\t\n<div class=\"lazyblock-kontaktschrankeh3trb-Z1hXBMd wp-block-lazyblock-kontaktschrankeh3trb\">\n\n    <div><!-- col -->\n      \n        <div class=\"bg-green p-5\">\n            <h4 class=\"h3 text-white\">Download Flyer<\/h4>\n            <p class=\"text-green-2\">          <p>Available in:<\/p>\n<ul>\n<li><strong>ENGLISH<\/strong><\/li>\n<\/ul>           <\/p>\n        <\/div>\n       \n        \n                        <div class=\"bg-blue btn icon noarrow\"><i class=\"icon-doc\"><\/i><\/div><button type=\"button\" class=\"btn bg-green-1\" data-bs-toggle=\"modal\" data-bs-target=\"#modale822d9e5a347680911098a3f4a28995a\">Download Flyer<\/button><br \/>\n                    \n\n\n <div 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I agree that my data are permanently stored to get in contact again. I can revoke my consent at any time by e-mail to <a href=\"mailto:info@smart-e-tech.de\">info@smart-e-tech.de<\/a>.<\/span><\/label><\/span><\/span><\/span>\n\t\t<\/p>\n\t\t<p><input class=\"wpcf7-form-control wpcf7-submit has-spinner btn btn-primary\" type=\"submit\" value=\"Send\" \/>\n\t\t<\/p>\n\t<\/div>\n<\/div><div class=\"wpcf7-response-output\" aria-hidden=\"true\"><\/div>\n<\/form>\n<\/div>\n     \n    <\/div>\n  <\/div>\n<\/div>\n\n                   \n\n        \n        \n    <\/div>\n\n\n\n\n  <!-- \n  <div class=\"bg-green-2\"><i class=\"icon-doc\"><\/i><\/div>    \n   --><\/div>\n\t<\/div>\n\n<\/div>\n\n                <\/div>\n            <\/div>\n          \n        <\/div>\n    <\/div><!-- \/container -->\n<\/section><!-- \/section --><\/div>\n\n<div class=\"wp-bootstrap-blocks-container container mb-2\">\n\t<\/div>\n\n\n<div class=\"lazyblock-content-section-Z1UKFD8 wp-block-lazyblock-content-section\">\n\n<section class=\"mt-5 mb-5\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\" bg-blue p-5\">\n                    \n\n<h2 class=\"wp-block-heading\" id=\"technische-daten\"><strong><strong>Technical data<\/strong><\/strong><\/h2>\n\n\n\n<figure class=\"wp-block-table text-blue\"><table><tbody><tr><td><strong>Test system type&nbsp;<\/strong>&nbsp;<\/td><td><strong>Dynamic H3TRB \/ AC-HTC \/<\/strong> <strong>DRB test system&nbsp;&nbsp;<\/strong><\/td><\/tr><tr><td><strong>Key parameter&nbsp;<\/strong>&nbsp;<\/td><td> <ul><li>80 &#8211; 240 DUT per system <\/li><li>(1 HV-power supply for 80 DUT)&nbsp;<\/li><li>0 V to 1500 V; 4 A for 80 DUT&nbsp;<\/li><li>Self or external stimuli<\/li><li>Stimuli frequencies up to 500khz<\/li><li>In-situ leakage measurement<\/li><li>Disconnect of failed DUTs&nbsp;<\/li><li>Fully automated test and report generation<\/li><\/ul><\/td><\/tr><\/tbody><\/table><\/figure>\n\n                <\/div>\n            <\/div>\n          \n        <\/div>\n    <\/div><!-- \/container -->\n<\/section><!-- \/section --><\/div>\n\n<div class=\"lazyblock-content-section-GtqeF wp-block-lazyblock-content-section\">\n\n<section class=\"mt-5 mb-5\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\"  p-0\">\n                    \n\n<h2 class=\"wp-block-heading\" id=\"warum-dynamisch-messen-mit-dem-h3trb-testsystem\"><strong><strong>Why use dynamic measuring with the H3TRB test system?<\/strong><\/strong><\/h2>\n\n\n<div class=\"wp-bootstrap-blocks-row row\">\n\t\n\n<div class=\"col-12 col-lg-6\">\n\t\t\t\n\n<p>The much faster switching operations that new wide bandgap technologies achieve in comparison to silicon-based technology also come with new fault mechanisms. Additionally, new standards require new testing procedures. The dynamic versions of the H3TRB \/ AC-HTC \/ DRB (dynamic reverse bias) test systems that have been developed by SET to stimulate these fault mechanisms.<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Choice of external or self stimulation<\/li>\n\n\n\n<li>Testing in lots of 80 DUTs, up to 3 lots per tester<\/li>\n\n\n\n<li>Supervision of switching operations<\/li>\n\n\n\n<li>In-situ measuring of parameters<\/li>\n\n\n\n<li>Detailed test reports<\/li>\n<\/ul>\n\n\t<\/div>\n\n\n\n<div class=\"col-12 col-lg-6\">\n\t\t\t\n<div class=\"lazyblock-youtube-2h7MQ4 wp-block-lazyblock-youtube\">\n\n\n                                <a class=\"videopreview \" href=\"#\" id=\"yt3fc0a5dc1f5757c71b88be8adbfd10e9\" data-bs-toggle=\"modal\" data-bs-target=\"#modal3fc0a5dc1f5757c71b88be8adbfd10e9\">\n                <div class=\"ratio ratio-16x9\">\n                    \n                <div class=\"playbutton\"><i class=\"icon-play \"><\/i><\/div>\n                                          \n         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With our inhouse \u201c<u><a href=\"https:\/\/www.smart-e-tech.de\/en\/semiconductor\/testing-as-a-service\/\">Testing as a Service<\/a><\/u>\u201d, we offer you a simple and fast testing directly at the experts on site.<\/p>\n\n\n<div class=\"wp-bootstrap-blocks-button\">\n\t<a\n\t\thref=\"https:\/\/www.smart-e-tech.de\/en\/company\/contact\/\"\n\t\t\t\t\t\tclass=\"btn mt-5 btn-primary\"\n\t>\n\t\tRequest\t<\/a>\n<\/div>\n\n\t<\/div>\n\n\n\n<div class=\"col-4 col-lg-3 order-1 order-lg-2 d-none d-lg-block\">\n\t\t\t\n\n<figure class=\"wp-block-image size-large\"><a href=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Dyn.-H3TRB-DRB-Testsysteme_Anfrage-1.png\"><img loading=\"lazy\" decoding=\"async\" width=\"956\" height=\"1024\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Dyn.-H3TRB-DRB-Testsysteme_Anfrage-1-956x1024.png\" alt=\"SET_Dyn. H3TRB-DRB Testsysteme\" class=\"wp-image-5951\" srcset=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Dyn.-H3TRB-DRB-Testsysteme_Anfrage-1-956x1024.png 956w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Dyn.-H3TRB-DRB-Testsysteme_Anfrage-1-280x300.png 280w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Dyn.-H3TRB-DRB-Testsysteme_Anfrage-1-768x823.png 768w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Dyn.-H3TRB-DRB-Testsysteme_Anfrage-1-560x600.png 560w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Dyn.-H3TRB-DRB-Testsysteme_Anfrage-1.png 1315w\" sizes=\"auto, (max-width: 956px) 100vw, 956px\" \/><\/a><\/figure>\n\n\t<\/div>\n\n<\/div>\n\n                <\/div>\n            <\/div>\n          \n        <\/div>\n    <\/div><!-- \/container -->\n<\/section><!-- \/section --><\/div>\n\n<div class=\"lazyblock-content-section-2oaCLn wp-block-lazyblock-content-section\">\n\n<section class=\"mt-5 mb-5\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\"text-col-2  p-0\">\n                    \n\n<h2 class=\"wp-block-heading mb-0\" id=\"prazise-und-hochaktuell-testsysteme-fur-wide-bandgap-halbleiter-von-set\"><strong><strong>Precise and truly up to date: dynamic H3TRB \/ AC-HTC \/<\/strong><\/strong> <strong><strong>DRB test systems<\/strong><\/strong><\/h2>\n\n\n\n<h3 class=\"wp-block-heading\" style=\"font-style:normal;font-weight:400\">for wide bandgap semiconductors by SET<\/h3>\n\n\n\n<p>SET adds years of experience and a proven track record to the development of innovative reliability tests for the semiconductor industry. Our technologies are truly up to date and future oriented. With our dynamic systems for testing and qualification of SiC and GaN semiconductors, we address the real challenges of the industry and are paving the way to establish relevant standards and guidelines.<\/p>\n\n\n\n<p>As a <strong>member of ECPE,<\/strong> SET is a partner in the <u><a href=\"https:\/\/www.ecpe.org\/research\/working-groups\/automotive-aqg-324\/\" target=\"_blank\" rel=\"noreferrer noopener\">working group AQG 324<\/a><\/u>. We constantly exchange with manufacturers, resellers, customers, institutes like JEDEC, research departments and academic institutions, to meet all requirements of the semiconductor industry in a targeted and anticipating way. We work on innovative testing and qualification solutions, which can be standardized to form a futureproof basis for new developments. Another important aspect of our commitment to dynamic testing procedures for wide bandgap semiconductors: For years, we have hosted the <a href=\"https:\/\/www.smart-e-tech.de\/en\/international-power-semiconductor-round-table\/\"><u>International<\/u> Power Semiconductor Reliability Round Table<\/a> for the power semiconductor industry.<\/p>\n\n                <\/div>\n            <\/div>\n          \n        <\/div>\n    <\/div><!-- \/container -->\n<\/section><!-- \/section --><\/div>\n\n<div class=\"wp-bootstrap-blocks-container container mb-5\">\n\t\n\n<figure class=\"wp-block-gallery has-nested-images columns-default is-cropped wp-block-gallery-1 is-layout-flex wp-block-gallery-is-layout-flex\">\n<figure class=\"wp-block-image size-large\"><a href=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/02\/SET_Dyn.-H3TRB-DRB-Testsysteme_Klimakammer_innen.jpg\"><img loading=\"lazy\" decoding=\"async\" width=\"1500\" height=\"1000\" data-id=\"3537\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/02\/SET_Dyn.-H3TRB-DRB-Testsysteme_Klimakammer_innen.jpg\" alt=\"SET Dyn. 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Our support team is always available to answer your questions and will be happy to provide you with a customized offer according to your requirements.<\/p>\n\n\n<div class=\"wp-bootstrap-blocks-button\">\n\t<a\n\t\thref=\"https:\/\/www.smart-e-tech.de\/en\/company\/contact\/\"\n\t\t\t\t\t\tclass=\"btn mt-5 btn-primary\"\n\t>\n\t\tRequest\t<\/a>\n<\/div>\n\n\t<\/div>\n\n\n\n<div class=\"col-4 col-lg-2 offset-lg-1 order-1 order-lg-2 d-none d-lg-block\">\n\t\t\t\n\n<figure class=\"wp-block-image size-medium is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"131\" height=\"328\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/\/2022\/01\/semiconductor.svg\" alt=\"\" class=\"wp-image-486\" style=\"width:66px;height:164px\"\/><\/figure>\n\n\t<\/div>\n\n<\/div>\n\n                <\/div>\n            <\/div>\n          \n        <\/div>\n    <\/div><!-- \/container -->\n<\/section><!-- \/section --><\/div>","protected":false},"excerpt":{"rendered":"","protected":false},"author":2,"featured_media":0,"parent":314,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-blank-without-container.php","meta":{"_acf_changed":false,"inline_featured_image":false,"footnotes":""},"class_list":["post-316","page","type-page","status-publish","hentry"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v25.0 - 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