{"id":320,"date":"2021-12-14T18:28:54","date_gmt":"2021-12-14T18:28:54","guid":{"rendered":"http:\/\/new.smart-e-tech.de\/semiconductor\/h3trb-htgb-testing\/"},"modified":"2024-04-10T11:18:35","modified_gmt":"2024-04-10T09:18:35","slug":"h3trb-htgb-test-systems","status":"publish","type":"page","link":"https:\/\/www.smart-e-tech.de\/en\/semiconductor\/h3trb-htgb-test-systems\/","title":{"rendered":"H(3)TRB &#038; HTGB test systems"},"content":{"rendered":"<div class=\"lazyblock-content-section-220FvK bg-green wp-block-lazyblock-content-section\">\n\n<section class=\"mt-0 mb-0\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\" green-gradient p-2\">\n                    \n<div class=\"wp-bootstrap-blocks-row row pt-5 pb-5\">\n\t\n\n<div class=\"col-12 col-lg-6 pt-5\">\n\t\t\t\n\n<h1 class=\"wp-block-heading\" id=\"verifizierung-und-validierung-mit-hil-testing\"><strong>H(3)TRB &amp; HTGB \/ HTGS test systems<\/strong><\/h1>\n\n\n\n<h2 class=\"wp-block-heading\" id=\"hardware-in-the-loop-testsysteme-fur-luft-und-raumfahrt-von-set\" style=\"font-style:normal;font-weight:400\">High performance &amp; High volume tests<\/h2>\n\n\n\n<p>SET offers the right product line for your customer needs \u2013 complete turnkey solution consisting of climatic chamber or oven with interior equipment and test item adaptation as well as the test system.<\/p>\n\n\n<div class=\"wp-bootstrap-blocks-row row\">\n\t\n\n<div class=\"col-6 col-md-10 col-lg-10\">\n\t\t\t\n<div class=\"lazyblock-youtube-Zv1TCF wp-block-lazyblock-youtube\">\n\n\n                                <a class=\"videopreview \" href=\"#\" id=\"yt87019fb492fe6f03c3bdb29cf2ffb6eb\" data-bs-toggle=\"modal\" data-bs-target=\"#modal87019fb492fe6f03c3bdb29cf2ffb6eb\">\n                <div class=\"ratio ratio-16x9\">\n                    \n                <div class=\"playbutton\"><i class=\"icon-play \"><\/i><\/div>\n                          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 <div class=\"col-lg-6 pt-5 pb-5 pe-5 ps-5 bg-grey-1 \">\n                            <h3 class=\"mb-3 pe-5\"><h2 class=\"mb-0\">Standardized testing solutions to ensure reliability of your power semiconduc&shy;tors<\/h2> <h3 class=\"fw-normal h2 mt-0\">HTRB, H(3)TRB &#038; HTGB \/ HTGS<\/h3><\/h3>\n                            In strategic testing, SET offers two product lines for reliability testing \u2013 the <strong>High performance &amp; high volume testers<\/strong>. The test systems HTRB (High Temperature Reverse Bias), H(3)TRB (High Humidity High Temperature Reverse Bias) and HTGB (High Temperature Gate Bias) \/ HTGS (High Temperature Gate Stress) all vary in terms of number of UUT channels and range of technical possibilities. Both stress test product lines are scalable, modular and standardized \u2013 enabling a fast time to market. At the same time, SET is flexible enough to make adjustments, where necessary. With modular semiconductor reliability test systems by SET, it is possible to test both discrete semiconductor components as well as power semiconductor modules in a fast and reliable way.                            \n                        <\/div>\n                        <div class=\"col-lg-6\" >\n                        <div class=\"bgimage h-100 ratio ratio-16x9\" style=\"background-image: url(https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_H3TRB_HTGB_statisch_02_web-2-1-1024x682.jpg\">\n\n                            <\/div>\n                         <\/div>\n                       \n                \n            <\/div>\n      \n    <\/div><!-- \/container -->\n<\/section><!-- \/section -->\n\n<\/div>\n\n<div class=\"lazyblock-content-section-Z1PBAbM pt-5 wp-block-lazyblock-content-section\" id=\"hpts\">\n\n<section class=\"mt-3 mb-3\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\"  p-0\">\n                    \n\n<h2 class=\"wp-block-heading\"><strong><strong>High performance test system<\/strong><\/strong><\/h2>\n\n\n\n<p>The High performance test systems offer additional functions beyond the pure High Temperature Reverse Bias (HTRB). This brings you important advantages.<\/p>\n\n\n<div class=\"wp-bootstrap-blocks-row row mt-5\">\n\t\n\n<div class=\"col-12 col-lg-8\">\n\t\t\t\n\n<h3 class=\"wp-block-heading\" style=\"font-style:normal;font-weight:400\">Higher utilization of the test device<\/h3>\n\n\n\n<p>Each DUT channel can be switched off separately and is actively limited to about 130% of the maximum current. This prevents any influence on adjacent channels and the faulty DUT can be analyzed later. Intermediate measurements can be skipped due to the possibility to fully automatic interrupt the stress tests for in-situ characterization of DUT parameters (Rth, Vgs(th), Vds, Vf, Vbreakdown, etc). After completion of the characterization, the system continues with the stress test completely unattended, which allows a significantly higher utilization of the device in everyday use.<\/p>\n\n\n<div class=\"lazyblock-youtube-Zl99sa wp-block-lazyblock-youtube\">\n\n\n                                <a class=\"videopreview \" href=\"#\" id=\"yt07d5938693cc3903b261e1a3844590ed\" data-bs-toggle=\"modal\" data-bs-target=\"#modal07d5938693cc3903b261e1a3844590ed\">\n                <div class=\"ratio ratio-16x9\">\n                    \n                <div class=\"playbutton\"><i class=\"icon-play \"><\/i><\/div>\n                                          \n                      <img decoding=\"async\" class=\"ytpreview\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/02\/Video_-Trends-Technologien-im-Power-Semiconductor-Markt-1024x576.jpg\">\n                                    <\/div>\n                <\/a>\n\n                \n    \n\n<script>\n  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I can revoke my consent at any time by e-mail to <a href=\"mailto:info@smart-e-tech.de\">info@smart-e-tech.de<\/a>.<\/span><\/label><\/span><\/span><\/span>\n\t\t<\/p>\n\t\t<p><input class=\"wpcf7-form-control wpcf7-submit has-spinner btn btn-primary\" type=\"submit\" value=\"Send\" \/>\n\t\t<\/p>\n\t<\/div>\n<\/div><div class=\"wpcf7-response-output\" aria-hidden=\"true\"><\/div>\n<\/form>\n<\/div>\n     \n    <\/div>\n  <\/div>\n<\/div>\n\n                   \n\n        \n        \n    <\/div>\n\n\n\n\n  <!-- \n  <div class=\"bg-green-2\"><i class=\"icon-doc\"><\/i><\/div>    \n   --><\/div>\n\t<\/div>\n\n<\/div>\n\n\n<div class=\"lazyblock-accordion-ZbqRr1 mt-5 wp-block-lazyblock-accordion\">\n<div class=\"accordion\" id=\"accordion-2746\">\n \n<!-- ACC Item-->\n     \n<div class=\"accordion-item\">\n <h3 class=\"accordion-header\" id=\"additional_elements-1\">\n   <button class=\"accordion-button collapsed\" type=\"button\" data-bs-toggle=\"collapse\" data-bs-target=\"#collapse-2746-1\" aria-expanded=\"false\" aria-controls=\"collapseadditional_elements-1\">\n   Reliability testing for high power dissipation DUTs   <\/button>\n <\/h3>\n <div id=\"collapse-2746-1\" class=\"accordion-collapse collapse\" aria-labelledby=\"heading2746-1\" data-bs-parent=\"#accordion-2746\">\n   <div class=\"accordion-body\">\n   <p>For components and modules with higher power, the system can be supplemented with individual temperature control for each test channel. The system determines the thermal resistance of the test object fully automatically and then carries out a highly accurate temperature control of each individual channel based on Tj. This prevents over-testing of DUTs and allows significantly higher temperatures especially for IGBTs and modules.<\/p>\n<p>\u00a0<\/p>\n     \n   <\/div>\n <\/div>\n<\/div>\n\n<!-- END ACC Item -->\n\n \n<!-- ACC Item-->\n     \n<div class=\"accordion-item\">\n <h3 class=\"accordion-header\" id=\"additional_elements-2\">\n   <button class=\"accordion-button collapsed\" type=\"button\" data-bs-toggle=\"collapse\" data-bs-target=\"#collapse-2746-2\" aria-expanded=\"false\" aria-controls=\"collapseadditional_elements-2\">\n   Key benefits stress test reliability    <\/button>\n <\/h3>\n <div id=\"collapse-2746-2\" class=\"accordion-collapse collapse\" aria-labelledby=\"heading2746-2\" data-bs-parent=\"#accordion-2746\">\n   <div class=\"accordion-body\">\n   <ul>\n<li>Focus on scalability in Test functions<\/li>\n<li>DUT disconnect on failure<\/li>\n<li>Integrated fully automatic ReadOut\/Characterizations<br \/>(Rth, Vgs(th), Vds, Vf, Vbreakdown, etc)<\/li>\n<li>The number of channels can be increased in steps of 20 channels<\/li>\n<li>Upgrading of Functions (for Example Gate Driver) possible by simple changing of cards.<\/li>\n<li>Available voltage classes: 1500V, 2000V, 3500V, 4200V<\/li>\n<li>Available currents up to 200mA\/DUT<\/li>\n<li>Switchable current ranges: Test standard and wide-bandgap DUTs<\/li>\n<li>Current Clamping to ~130% of current range, latched DUT disable in ~20ms<\/li>\n<li><strong>Single DUT Temperation: <\/strong>\n<ul>\n<li>Controlling the ambient temperature on Tj, not on Tcase or Tambient,<\/li>\n<li>Regulation accuracy of Tj up to +\/-0,25\u00b0C<\/li>\n<li>Available as drawer or external Trolley<\/li>\n<\/ul>\n<\/li>\n<\/ul>\n     \n   <\/div>\n <\/div>\n<\/div>\n\n<!-- END ACC Item -->\n\n \n<!-- ACC Item-->\n     \n<div class=\"accordion-item\">\n <h3 class=\"accordion-header\" id=\"additional_elements-3\">\n   <button class=\"accordion-button collapsed\" type=\"button\" data-bs-toggle=\"collapse\" data-bs-target=\"#collapse-2746-3\" aria-expanded=\"false\" aria-controls=\"collapseadditional_elements-3\">\n   Choose the right tester for your requirement   <\/button>\n <\/h3>\n <div id=\"collapse-2746-3\" class=\"accordion-collapse collapse\" aria-labelledby=\"heading2746-3\" data-bs-parent=\"#accordion-2746\">\n   <div class=\"accordion-body\">\n   <p>We offer fast and easy pre-configured test systems that save you valuable time and costs in the development phase of power semiconductors. Select the right configuration for your reliability test.<\/p>\n   <div class=\" bg-blue p-2\">\n                    \n\n<figure class=\"wp-block-table\"><table><tbody><tr><td><\/td><td><img decoding=\"async\" loading=\"lazy\" width=\"1146\" height=\"1053\" class=\"wp-image-4192\" style=\"width: 200px;\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_H3TRB_HTGB_statisch_TS-1_web-1.png\" alt=\"\" srcset=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_H3TRB_HTGB_statisch_TS-1_web-1.png 1146w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_H3TRB_HTGB_statisch_TS-1_web-1-300x276.png 300w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_H3TRB_HTGB_statisch_TS-1_web-1-1024x941.png 1024w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_H3TRB_HTGB_statisch_TS-1_web-1-768x706.png 768w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_H3TRB_HTGB_statisch_TS-1_web-1-600x551.png 600w\" sizes=\"auto, (max-width: 1146px) 100vw, 1146px\"><br><\/td><td><img decoding=\"async\" loading=\"lazy\" width=\"1160\" height=\"1126\" class=\"wp-image-4885\" style=\"width: 200px;\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Performance_Test_System_2.png\" alt=\"High performance test system 2\" srcset=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Performance_Test_System_2.png 1160w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Performance_Test_System_2-300x291.png 300w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Performance_Test_System_2-1024x994.png 1024w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Performance_Test_System_2-768x745.png 768w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Performance_Test_System_2-600x582.png 600w\" sizes=\"auto, (max-width: 1160px) 100vw, 1160px\"><\/td><td><img decoding=\"async\" loading=\"lazy\" width=\"1133\" height=\"1140\" class=\"wp-image-4887\" style=\"width: 200px;\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Performance_Test_System_3.png\" alt=\"High performance test system 3\" srcset=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Performance_Test_System_3.png 1133w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Performance_Test_System_3-298x300.png 298w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Performance_Test_System_3-1018x1024.png 1018w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Performance_Test_System_3-150x150.png 150w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Performance_Test_System_3-768x773.png 768w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Performance_Test_System_3-596x600.png 596w\" sizes=\"auto, (max-width: 1133px) 100vw, 1133px\"><\/td><\/tr><tr><td><\/td><td><span class=\"fw-bold\">High performance test system 1<\/span><\/td><td><span class=\"fw-bold\">High performance test system 2<\/span><\/td><td><span class=\"fw-bold\">High performance test system 3<\/span><\/td><\/tr><tr><td>Volt<\/td><td>3500V, two independent tests with 30 DUTs each&nbsp;| HTRB\/H3TRB<\/td><td>2000V, 40 DUTs, HTRB, Readout functionality<\/td><td>2000V, 80 DUTs, HTRB, extendable in groups of 40 up to 240 DUTs<\/td><\/tr><tr><td>DUTs<\/td><td>Full DUT disconnect, Vstress measurement<br><ul><li>prepared for Gate drive for HTGS<\/li><li>prepared for Readout functionality<\/li><li>prepared for extending to 40 DUTs each<\/li><\/ul><\/td><td>Single DUT disable, Vstress measurement<br> <ul><li>Gate drive up to +\/-30V, +\/- 10mA, accuracy 0.1V<\/li><li>Automatic interruption of HTRB for fully automatic readouts<\/li><li>Characterization of Vgs, Vds, Vbreakdown, Vf<\/li><\/ul><\/td><td>Single DUT disable<br><ul><li>Adding of Gate drive possible on site<\/li><\/ul><\/td><\/tr><tr><td>Switchable source current measurement<\/td><td><ul><li>200mA, 40uA accuracy, 15nA resolution<\/li><li>10mA, 2uA accuracy, 750pA resolution<\/li><\/ul><\/td><td><ul><li>20mA, 4uA accuracy, 1,5nA resolution<\/li><li>1mA, 200nA accuracy, 75pA resolution<\/li><\/ul><\/td><td><ul><li>20mA, 4uA accuracy, 1,5nA resolution<\/li><li>1mA, 200nA accuracy, 75pA resolution<\/li><\/ul><\/td><\/tr><tr><td>Climate chamber<\/td><td>External Oven or Trolley with Single-DUT tempering<\/td><td>Drawer with single DUT tempering on Tj<\/td><td>\u2013<\/td><\/tr><\/tbody><\/table><\/figure>\n\n                <\/div>  \n   <\/div>\n <\/div>\n<\/div>\n\n<!-- END ACC Item -->\n\n\n\n<\/div><\/div>\n                <\/div>\n            <\/div>\n          \n        <\/div>\n    <\/div><!-- \/container -->\n<\/section><!-- \/section --><\/div>\n\n<div class=\"lazyblock-content-section-jlbhe mb-5 wp-block-lazyblock-content-section\" id=\"hvts\">\n\n<section class=\"mt-5 mb-5\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\"  p-0\">\n                    \n\n<h2 class=\"wp-block-heading mt-5\"><strong>High volume test system<\/strong><\/h2>\n\n\n\n<p>This product line scales excellently in the number of DUTs <strong>up to 960 channels per rack<\/strong>. The system handles separate test sequences for the channels in groups of 80 DUTs and separate environmental parameters (<strong>humidity\/temperature<\/strong>) for the DUTs in groups of 240. Each DUT Channel offers two separated current measurements on <strong>Gate and Source<\/strong>. The <strong>modular design<\/strong> allows the systems to be upgraded at the customers site in steps of 80 DUT channels.<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Focus on <strong>scalability<\/strong> of DUT Channels<\/li>\n\n\n\n<li>Testing of <strong>high volumes<\/strong> of DUTs on small space<\/li>\n\n\n\n<li>Source and Gate current measurement per DUT<\/li>\n\n\n\n<li>Gate stimuli compatible with <strong>wide bandgap semiconductors<\/strong>, such as silicon carbide (SiC) and gallium nitride (GaN)<\/li>\n<\/ul>\n\n\n<div class=\"lazyblock-accordion-Z20mcT1 wp-block-lazyblock-accordion\">\n<div class=\"accordion\" id=\"accordion-7945\">\n \n<!-- ACC Item-->\n     \n<div class=\"accordion-item\">\n <h3 class=\"accordion-header\" id=\"additional_elements-1\">\n   <button class=\"accordion-button collapsed\" type=\"button\" data-bs-toggle=\"collapse\" data-bs-target=\"#collapse-7945-1\" aria-expanded=\"false\" aria-controls=\"collapseadditional_elements-1\">\n   Key benefits of high volume test systems   <\/button>\n <\/h3>\n <div id=\"collapse-7945-1\" class=\"accordion-collapse collapse\" aria-labelledby=\"heading7945-1\" data-bs-parent=\"#accordion-7945\">\n   <div class=\"accordion-body\">\n   <ul>\n<li>Up to 12*80=960 DUTs in a 19\u201cRack<\/li>\n<li>Delivered Racks can be scaled to higher DUTs numbers on site<\/li>\n<li>Independent Testing for multiples of 80 DUTs<\/li>\n<li>Independent environment parameters for multiples of 240 DUTs<\/li>\n<li>Standard Interface to interface all common Ovens and climate chambers<\/li>\n<li>HTGB with current measurement on Source and Gate<\/li>\n<li>Up to 2000V, 4mA\/DUT, Gate +\/- 35V<\/li>\n<\/ul>\n     \n   <\/div>\n <\/div>\n<\/div>\n\n<!-- END ACC Item -->\n\n \n<!-- ACC Item-->\n     \n<div class=\"accordion-item\">\n <h3 class=\"accordion-header\" id=\"additional_elements-2\">\n   <button class=\"accordion-button collapsed\" type=\"button\" data-bs-toggle=\"collapse\" data-bs-target=\"#collapse-7945-2\" aria-expanded=\"false\" aria-controls=\"collapseadditional_elements-2\">\n   Example configuration   <\/button>\n <\/h3>\n <div id=\"collapse-7945-2\" class=\"accordion-collapse collapse\" aria-labelledby=\"heading7945-2\" data-bs-parent=\"#accordion-7945\">\n   <div class=\"accordion-body\">\n   <p><a href=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Volume_Beispielkonfiguration.png\"><img loading=\"lazy\" decoding=\"async\" class=\"alignright wp-image-4889 size-medium\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Volume_Beispielkonfiguration-210x300.png\" alt=\"High Volume Beispielkonfiguration\" width=\"210\" height=\"300\" srcset=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Volume_Beispielkonfiguration-210x300.png 210w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Volume_Beispielkonfiguration-718x1024.png 718w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Volume_Beispielkonfiguration-768x1096.png 768w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Volume_Beispielkonfiguration-1077x1536.png 1077w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Volume_Beispielkonfiguration-421x600.png 421w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Volume_Beispielkonfiguration-670x956.png 670w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/High_Volume_Beispielkonfiguration.png 1209w\" sizes=\"auto, (max-width: 210px) 100vw, 210px\" \/><\/a><\/p>\n<p>The <strong>high volume test system<\/strong> is already preconfigured and thus saves valuable time and costs in the development phase of power semiconductors.<\/p>\n<ul>\n<li><strong>240 DUTs<\/strong> Options for extending to 480, 720 and 960 on side<\/li>\n<li>MassInterface connector to <strong>external oven<\/strong><\/li>\n<li><strong>Independent testing<\/strong> per 240DUTs (H3TRB\/HTRB\/HTGS)<\/li>\n<li>Up to <strong>2000V, 1mA per DUT<\/strong>\n<ul>\n<li>Source current measurement: ~1uA accuracy, 0.1Hz per DUT<\/li>\n<li>Gate drive: up to +\/-25V, 0.1mA, in groups of 40 SW definable<\/li>\n<li>Gate current measurement: ~0.5uA accuracy, 0.1Hz per DUT<\/li>\n<li>Characteristics changeable with card swapping<\/li>\n<\/ul>\n<\/li>\n<\/ul>\n     \n   <\/div>\n <\/div>\n<\/div>\n\n<!-- END ACC Item -->\n\n\n\n<\/div><\/div>\n                <\/div>\n            <\/div>\n          \n        <\/div>\n    <\/div><!-- \/container -->\n<\/section><!-- \/section --><\/div>\n\n<div class=\"wp-bootstrap-blocks-container container mb-2\">\n\t\n\n<figure class=\"wp-block-gallery has-nested-images columns-4 is-cropped wp-block-gallery-1 is-layout-flex wp-block-gallery-is-layout-flex\">\n<figure class=\"wp-block-image size-large\"><a href=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/IMG_0014-1.jpg\"><img loading=\"lazy\" decoding=\"async\" width=\"1333\" height=\"1754\" data-id=\"4250\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/IMG_0014-1.jpg\" alt=\"High volume test system\" class=\"wp-image-4250\" srcset=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/IMG_0014-1.jpg 1333w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/IMG_0014-1-228x300.jpg 228w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/IMG_0014-1-778x1024.jpg 778w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/IMG_0014-1-768x1011.jpg 768w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/IMG_0014-1-1167x1536.jpg 1167w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/IMG_0014-1-456x600.jpg 456w\" sizes=\"auto, (max-width: 1333px) 100vw, 1333px\" \/><\/a><\/figure>\n\n\n\n<figure class=\"wp-block-image size-large\"><a href=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/Prueflinge-mit-Einschubkarte-in-der-Klimakammer.jpg\"><img loading=\"lazy\" decoding=\"async\" width=\"800\" height=\"533\" data-id=\"4206\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/Prueflinge-mit-Einschubkarte-in-der-Klimakammer.jpg\" alt=\"\" class=\"wp-image-4206\" srcset=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/Prueflinge-mit-Einschubkarte-in-der-Klimakammer.jpg 800w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/Prueflinge-mit-Einschubkarte-in-der-Klimakammer-300x200.jpg 300w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/Prueflinge-mit-Einschubkarte-in-der-Klimakammer-768x512.jpg 768w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/Prueflinge-mit-Einschubkarte-in-der-Klimakammer-600x400.jpg 600w\" sizes=\"auto, (max-width: 800px) 100vw, 800px\" \/><\/a><\/figure>\n\n\n\n<figure class=\"wp-block-image size-large\"><a href=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET-05292013-008-1-400x258-1.jpg\"><img loading=\"lazy\" decoding=\"async\" width=\"400\" height=\"258\" data-id=\"4210\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET-05292013-008-1-400x258-1.jpg\" alt=\"DUTs in a H(3)TRB climate chamber\" class=\"wp-image-4210\" srcset=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET-05292013-008-1-400x258-1.jpg 400w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET-05292013-008-1-400x258-1-300x194.jpg 300w\" sizes=\"auto, (max-width: 400px) 100vw, 400px\" \/><\/a><\/figure>\n\n\n\n<figure class=\"wp-block-image size-large\"><a href=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET-05292013-004-400x267-1.jpg\"><img loading=\"lazy\" decoding=\"async\" width=\"400\" height=\"267\" data-id=\"4208\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET-05292013-004-400x267-1.jpg\" alt=\"Analyze the running H(3)TRB test\" class=\"wp-image-4208\" srcset=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET-05292013-004-400x267-1.jpg 400w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET-05292013-004-400x267-1-300x200.jpg 300w\" sizes=\"auto, (max-width: 400px) 100vw, 400px\" \/><\/a><\/figure>\n<\/figure>\n\n<\/div>\n\n\n<div class=\"lazyblock-content-section-ZQoRnm wp-block-lazyblock-content-section\">\n\n<section class=\"mt-5 mb-5\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\" bg-blue p-5\">\n                    \n\n<h2 class=\"wp-block-heading\">Technical Data<\/h2>\n\n\n\n<figure class=\"wp-block-table\"><table><tbody><tr><td><\/td><td><span class=\"fw-bold\">High performance test system<\/span><\/td><td><span class=\"fw-bold\">High volume test system<\/span><\/td><\/tr><tr><td><strong>Devices under test (DUTs) per system (fully monitored)<\/strong><\/td><td>Up to 240 DUTs with stepsize of 20<\/td><td>240 &#8211; 960 (for a cabinet)<\/td><\/tr><tr><td><strong>HTRB test voltage<\/strong><\/td><td>300V, 600V, 1000V, 1500V, 2000V, 3500V, 4200V<\/td><td>60V, 150V, 300V, 600V, 1000V, 1500V, 2000V<\/td><\/tr><tr><td><strong>Source current measurement ranges<\/strong><\/td><td>500\u00b5A, 1mA, 10mA, 20mA, 100mA, 200mA<\/td><td>500\u00b5A, 1mA, 4mA<\/td><\/tr><tr><td><strong>Gate voltage<\/strong><\/td><td>-40V to +40V,<br>SW configurable<\/td><td>-35V to +35V,<br>SW configurable<\/td><\/tr><tr><td><strong>Gate current range<\/strong><\/td><td>10\u00b5A, 10mA<\/td><td>4\u00b5A, 2mA<\/td><\/tr><tr><td><strong>Features<\/strong><\/td><td>HTGS capability,<br>Current Range Switching,<br>DUT current clamping,<br>DUT disconnect on failure<\/td><td>HTGS capability<\/td><\/tr><tr><td><strong>Insitu measurements<\/strong><\/td><td>Rth, Vgs(th), Vds, Vf, Vbreakdown<\/td><td>\u2013<\/td><\/tr><tr><td><strong>Single DUT temperature control<\/strong><\/td><td>Tj control +\/-0.5\u00b0C<\/td><td>\u2013<\/td><\/tr><\/tbody><\/table><\/figure>\n\n                <\/div>\n            <\/div>\n          \n        <\/div>\n    <\/div><!-- \/container -->\n<\/section><!-- \/section --><\/div>\n\n<div class=\"lazyblock-content-section-MqpqS wp-block-lazyblock-content-section\">\n\n<section class=\"mt-5 mb-5\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\" bg-green p-5\">\n                    \n\n<p class=\"has-text-color\" style=\"color:#05ff87\"><strong>REQUEST<\/strong><\/p>\n\n\n\n<div style=\"height:20px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n<div class=\"wp-bootstrap-blocks-row row\">\n\t\n\n<div class=\"col-12 col-lg-8 order-2 order-lg-1\">\n\t\t\t\n\n<h2 class=\"wp-block-heading\" id=\"sie-haben-fragen-zu-den-halbleiter-testsystemen-oder-wunschen-ein-angebot\" style=\"font-style:normal;font-weight:400\">Do you have questions about the H(3)TRB &amp; HTGB test system or would you like an offer?<\/h2>\n\n\n\n<p>Our support team is available to answer your questions at any time and will be happy to provide you with a customized offer according to your requirements.<\/p>\n\n\n\n<p>You would like to have your DUTs tested at our premises for the time being? With our in-house service &#8220;<u><a href=\"https:\/\/www.smart-e-tech.de\/en\/semiconductor\/testing-as-a-service\/\">Testing as a Service<\/a><\/u>&#8221; we offer you simple and fast testing directly at the expert&#8217;s site.&nbsp;&nbsp;&nbsp;<\/p>\n\n\n<div class=\"wp-bootstrap-blocks-button\">\n\t<a\n\t\thref=\"https:\/\/www.smart-e-tech.de\/en\/company\/contact\/\"\n\t\t\t\t\t\tclass=\"btn mt-5 btn-primary\"\n\t>\n\t\tRequest\t<\/a>\n<\/div>\n\n\t<\/div>\n\n\n\n<div class=\"col-8 col-lg-4 order-1 order-lg-2 d-none d-lg-block\">\n\t\t\t\n\n<figure class=\"wp-block-image size-large is-resized p-0\"><a href=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/05\/NXP_IMG_0667_web.png\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"682\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/05\/NXP_IMG_0667_web-1024x682.png\" alt=\"H(3)TRB &amp; HTGB \/ HTGS test system\" class=\"wp-image-8750\" style=\"width:768px;height:512px\" srcset=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/05\/NXP_IMG_0667_web-1024x682.png 1024w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/05\/NXP_IMG_0667_web-300x200.png 300w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/05\/NXP_IMG_0667_web-768x512.png 768w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/05\/NXP_IMG_0667_web-1536x1024.png 1536w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/05\/NXP_IMG_0667_web-600x400.png 600w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/05\/NXP_IMG_0667_web-670x447.png 670w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/05\/NXP_IMG_0667_web-1340x893.png 1340w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/05\/NXP_IMG_0667_web.png 2000w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/a><\/figure>\n\n\t<\/div>\n\n<\/div>\n\n                <\/div>\n            <\/div>\n          \n        <\/div>\n    <\/div><!-- \/container -->\n<\/section><!-- \/section --><\/div>","protected":false},"excerpt":{"rendered":"","protected":false},"author":2,"featured_media":0,"parent":314,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-blank-without-container.php","meta":{"_acf_changed":false,"inline_featured_image":false,"footnotes":""},"class_list":["post-320","page","type-page","status-publish","hentry"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v25.0 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>H(3)TRB, HTRB and HTGB \/ HTGS Test Systems | SET GmbH<\/title>\n<meta name=\"description\" content=\"Standardized test solutions as HTRB, H(3)TRB &amp; 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