{"id":322,"date":"2022-01-21T16:07:33","date_gmt":"2022-01-21T16:07:33","guid":{"rendered":"http:\/\/new.smart-e-tech.de\/semiconductor\/customized-test-solutions\/"},"modified":"2022-04-14T12:08:19","modified_gmt":"2022-04-14T10:08:19","slug":"customized-testing-solutions","status":"publish","type":"page","link":"https:\/\/www.smart-e-tech.de\/en\/semiconductor\/customized-testing-solutions\/","title":{"rendered":"Customized testing solutions"},"content":{"rendered":"<div class=\"lazyblock-header-16uQHv wp-block-lazyblock-header\">\n<section style=\"background-image: url(https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/02\/SET_Kundensezifische-Testloesungen-2200x900.jpg)\" class=\"content-section content-header pt-lg-5 pb-lg-5\">\n    <div class=\"container\">\n        <div class=\"row\">\n            <div class=\"col-12 col-lg-6\">\n                <div class=\"greenbox p-5\">\n                    <h1 class=\"mb-0\">Customized testing solutions<\/h1>\n                    <h2 class=\"h1 fw-normal\">Reliability tests for your power semiconductors <\/h2>\n                    <p class=\"fw-bold\">At SET, we offer individual test systems that are specifically customized \u2013 from static and dynamic all the way to function and production testers for effective and meaningful reliability tests. <\/p>\n                <\/div>\n            <\/div>\n        <\/div>\n    <\/div>\n  \n<\/section><!-- \/section --><\/div>\n\n<div class=\"lazyblock-breadcrumb-ZJk0MO wp-block-lazyblock-breadcrumb\"><div class=\"container\">\n    <div class=\"row\">\n        <div class=\"col\">\n            <nav class=\"breadcrumb mb-4 mt-2 small\"><a href=\"https:\/\/www.smart-e-tech.de\/en\/\">Start<\/a><span class=\"divider\">&nbsp;&rsaquo;&nbsp;<\/span><a href=\"https:\/\/www.smart-e-tech.de\/en\/company\/\">Company<\/a> <span class=\"divider\">&nbsp;&rsaquo;&nbsp;<\/span> News<\/nav>        <\/div>\n    <\/div>\n<\/div>\n<\/div>\n\n<div class=\"lazyblock-content-section-ZWAezw wp-block-lazyblock-content-section\">\n\n<section class=\"mt-5 mb-5\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\"  p-0\">\n                    \n<div class=\"wp-bootstrap-blocks-row row\">\n\t\n\n<div class=\"col-12 col-lg-8\">\n\t\t\t\n\n<h2 class=\"wp-block-heading\"><strong><strong>Individual test systems for highest customer demands<\/strong><\/strong><\/h2>\n\n\n\n<p>Test systems by SET are state of the art in both technology and method, but they are also highly flexible. Consequently, you get customized testing solutions that are fully aligned to your individual requirements and you also get the assurance of a recognized quality test.&nbsp;<\/p>\n\n\n\n<p>With SET\u2018s longstanding experience, the close contact to our customers, our cooperation with universities and our membership with the European Center for Power Electronics e.V. (ECPE), we contribute to the development of the <strong>latest technologies <\/strong>to make sure that our semiconductor test systems fulfil the most up-to-date requirements.<\/p>\n\n\n\n<p>We use our know-how to support you in handling your projects from definition of the system requirements to implementing and commissioning the complete special test system, and we also provide you with a fast and efficient configuration of a test system that is adapted to your ideas and the most diverse of application cases.<\/p>\n\n\t<\/div>\n\n\n\n<div class=\"col-12 col-lg-4\">\n\t\t\t\n<div class=\"lazyblock-calltoaction-Z2kbFgM wp-block-lazyblock-calltoaction\">\n\n    <div><!-- col -->\n      \n        <div class=\"bg-blue p-5\">\n            <h4 class=\"h3 text-white\">Request a test system <\/h4>\n            <h3 class=\"h3 text-white fw-normal\">Customized testing solutions<\/h3>\n            <p class=\"text-green-2\">          We look forward to working with you!           <\/p>\n        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While the shift towards new wide bandgap materials looks promising, it is also connected to numerous challenges for the semiconductor industry.<\/p>\n<ul>\n<li>Customers expect optimum performance and quality from the new semiconductors.<\/li>\n<li>Manufacturers need to introduce new technologies for chip manufacturing.<\/li>\n<li>When new materials, new production processes and highest customer demands come together, this leads to a challenging combination that calls for a robust quality management.<\/li>\n<li>Power semiconductor tests that are specifically adapted to the material at hand are going to play a crucial role for quality assurance.<\/li>\n<li>Models based on the field data for silicon-based chip production are not suitable when testing wide bandgap semiconductors.<\/li>\n<li>We now need to collect more data than before to conduct qualification tests regarding lifetime, reliability and stress<\/li>\n<\/ul>                            \n                        <\/div>\n                \n            <\/div>\n      \n    <\/div><!-- \/container -->\n<\/section><!-- \/section -->\n<\/div>\n\n<div class=\"lazyblock-content-section-21cYTB keinabstand-oben wp-block-lazyblock-content-section\">\n\n<section class=\"mt-0 mb-0\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\" bg-grey-1 p-5\">\n                    \n\n<p>SET faces these challenges by constantly researching and developing new test procedures. We use this expertise in-house for the <a href=\"https:\/\/www.smart-e-tech.de\/en\/expertise\/software-development\/\">development <\/a>and <a href=\"https:\/\/www.smart-e-tech.de\/en\/expertise\/electronics-manufacturing\/\">production<\/a> of our test systems and our electronics.\u00a0<\/p>\n\n\n\n<p>As a leading specialist for test systems in semiconductor reliability testing, you can count on SET for customized testing solutions. We will either accompany you through your development phase and prior to starting production or we serve as your production and function tester while your production start is pending.<\/p>\n\n                <\/div>\n            <\/div>\n          \n        <\/div>\n    <\/div><!-- \/container -->\n<\/section><!-- \/section --><\/div>\n\n\n<p><\/p>\n\n\n\n<p><\/p>\n\n\n<div class=\"lazyblock-content-section-Z13tH0h wp-block-lazyblock-content-section\">\n\n<section class=\"mt-5 mb-5\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\"  p-0\">\n                    \n<div class=\"wp-bootstrap-blocks-row row\">\n\t\n\n<div class=\"col-6 col-lg-4\">\n\t\t\t\n\n<figure class=\"wp-block-image size-large\"><a href=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Infineon_HTOL_01_grau-1.jpg\"><img loading=\"lazy\" decoding=\"async\" width=\"856\" height=\"1024\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Infineon_HTOL_01_grau-1-856x1024.jpg\" alt=\"\" class=\"wp-image-5172\" srcset=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Infineon_HTOL_01_grau-1-856x1024.jpg 856w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Infineon_HTOL_01_grau-1-251x300.jpg 251w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Infineon_HTOL_01_grau-1-768x919.jpg 768w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Infineon_HTOL_01_grau-1-1284x1536.jpg 1284w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Infineon_HTOL_01_grau-1-501x600.jpg 501w, https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/03\/SET_Infineon_HTOL_01_grau-1.jpg 1333w\" sizes=\"auto, (max-width: 856px) 100vw, 856px\" \/><\/a><\/figure>\n\n\t<\/div>\n\n\n\n<div class=\"col-12 col-lg-8\">\n\t\t\t\n\n<h2 class=\"wp-block-heading\" style=\"font-style:normal;font-weight:400\"><\/h2>\n\n\n\n<h2 class=\"mb-0 wp-block-heading\"><strong>Application example<\/strong><\/h2>\n\n\n\n<h3 class=\"wp-block-heading\" style=\"font-style:normal;font-weight:400\">customized test system &#8220;HTOL\u201c<\/h3>\n\n\n\n<h4 class=\"wp-block-heading\"><strong><strong>System\u2019s specific features<\/strong><\/strong><\/h4>\n\n\n\n<ul class=\"wp-block-list\"><li>Complete logging of all devices under test during the complete test phase<\/li><li>Exact temperature control of each test object on its semiconductor structure<\/li><li>RF load of the samples possible<\/li><li>High throughput for each system<\/li><li>Fully automated test procedure<\/li><li>Automated test continuation according to characterization<\/li><li>Freely programmable test system based on National Instruments\u2019 COTS platform<\/li><li>No test interruptions due to defective DUTs<\/li><li>Integrated safety system<\/li><\/ul>\n\n\n<div class=\"lazyblock-accordion-Z20IoYF wp-block-lazyblock-accordion\">\n<div class=\"accordion\" id=\"accordion-965\">\n \n<!-- ACC Item-->\n     \n<div class=\"accordion-item\">\n <h3 class=\"accordion-header\" id=\"additional_elements-1\">\n   <button class=\"accordion-button collapsed\" type=\"button\" data-bs-toggle=\"collapse\" data-bs-target=\"#collapse-965-1\" aria-expanded=\"false\" aria-controls=\"collapseadditional_elements-1\">\n   Technical Data   <\/button>\n <\/h3>\n <div id=\"collapse-965-1\" class=\"accordion-collapse collapse\" aria-labelledby=\"heading965-1\" data-bs-parent=\"#accordion-965\">\n   <div class=\"accordion-body\">\n   \n   <div class=\" bg-blue p-5\">\n                    \n\n<figure class=\"wp-block-table\"><table><tbody><tr><td>Devices under test (DUT\u2018S) per system (fully monitored)<\/td><td>16<\/td><\/tr><tr><td>DUT supply voltage (VDD)<\/td><td>1 V \u2013 5.5 V<\/td><\/tr><tr><td>V<sub>DD<\/sub> output current per DUT<\/td><td>10 mA<\/td><\/tr><tr><td>V<sub>DD<\/sub> remote sense<\/td><td><i class=\"icon-Haken \"><\/i><\/td><\/tr><tr><td>V<sub>DD<\/sub> and supply current monitoring<\/td><td><i class=\"icon-Haken \"><\/i><\/td><\/tr><tr><td>V<sub>DD<\/sub> adjustable and switchable by software<\/td><td><i class=\"icon-Haken \"><\/i><\/td><\/tr><tr><td>Flexible FPGA DUT communication<\/td><td><i class=\"icon-Haken \"><\/i><\/td><\/tr><tr><td>Single DUT junction temperature control<\/td><td><i class=\"icon-Haken \"><\/i><\/td><\/tr><tr><td>Adjustable test temperature<\/td><td>50 \u00b0C \u2013 175 \u00b0C<\/td><\/tr><tr><td>Power dissipation per DUT<\/td><td>500 mW<\/td><\/tr><tr><td>Ramp up time (25 \u00b0C to 175 \u00b0C)<\/td><td>&lt; 20 min<\/td><\/tr><tr><td>Ramp down time (175 \u00b0C to 50 \u00b0C)<\/td><td>&lt; 30 min<\/td><\/tr><tr><td>Virtual Tj measurement<\/td><td><i class=\"icon-Haken \"><\/i><\/td><\/tr><tr><td>RF Stimuli Frequency<\/td><td>600 MHz \u2013 2200 MHz<\/td><\/tr><tr><td>RF Stimuli power<\/td><td>10 W<\/td><\/tr><\/tbody><\/table><\/figure>\n\n                <\/div>  \n   <\/div>\n <\/div>\n<\/div>\n\n<!-- END ACC Item -->\n\n\n\n<\/div><\/div>\n\t<\/div>\n\n<\/div>\n\n                <\/div>\n            <\/div>\n          \n        <\/div>\n    <\/div><!-- \/container -->\n<\/section><!-- \/section --><\/div>\n\n<div class=\"lazyblock-content-section-Z28lU5b wp-block-lazyblock-content-section\">\n\n<section class=\"mt-5 mb-5\">\n    <div class=\"container \">\n        <div class=\"row\"> \n            <div class=\"col\">\n                <div class=\" bg-green p-5\">\n                    \n\n<p class=\"has-text-color\" style=\"color:#05ff87\"><strong>REQUEST<\/strong><\/p>\n\n\n\n<div style=\"height:20px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n<div class=\"wp-bootstrap-blocks-row row\">\n\t\n\n<div class=\"col-12 col-lg-9 pr-5 order-2 order-lg-1\">\n\t\t\t\n\n<h2 class=\"wp-block-heading\" id=\"sie-haben-fragen-zu-den-halbleiter-testsystemen-oder-wunschen-ein-angebot\" style=\"font-style:normal;font-weight:400\">Looking for a customized testing solution?<\/h2>\n\n\n\n<p>We look forward to facing your technical challenges and to developing a test system according to your ideas<\/p>\n\n\n\n<p>Prefer to have your UUTs tested externally for now? With our in-house service \u201e<u><a href=\"https:\/\/www.smart-e-tech.de\/en\/semiconductor\/testing-as-a-service\/\">Testing as a Service<\/a><\/u>\u201c, you will get simple and fast tests directly on the expert\u2019s premises.&nbsp;&nbsp;&nbsp;<\/p>\n\n\n<div class=\"wp-bootstrap-blocks-button\">\n\t<a\n\t\thref=\"https:\/\/www.smart-e-tech.de\/en\/company\/contact\/\"\n\t\t\t\t\t\tclass=\"btn mt-5 btn-primary\"\n\t>\n\t\tRequest\t<\/a>\n<\/div>\n\n\t<\/div>\n\n\n\n<div class=\"col-4 col-lg-2 offset-lg-1 order-1 order-lg-2 d-none d-lg-block\">\n\t\t\t\n\n<figure class=\"wp-block-image size-medium is-resized\"><img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/www.smart-e-tech.de\/wp-content\/uploads\/2022\/01\/semiconductor.svg\" alt=\"\" class=\"wp-image-486\" width=\"66\" height=\"164\"\/><\/figure>\n\n\t<\/div>\n\n<\/div>\n\n                <\/div>\n            <\/div>\n          \n        <\/div>\n    <\/div><!-- \/container -->\n<\/section><!-- \/section --><\/div>","protected":false},"excerpt":{"rendered":"","protected":false},"author":2,"featured_media":0,"parent":314,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-blank-without-container.php","meta":{"_acf_changed":false,"inline_featured_image":false,"footnotes":""},"class_list":["post-322","page","type-page","status-publish","hentry"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v25.3 - 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