Digital Power Semiconductor Reliability Roundtable 20202020-08-17T17:04:04+00:00

Power Semiconductor Reliability Round Table

The Power Semiconductor Reliability Round Table is our expert conference format regarding today’s and future challenges in Power Semiconductor Reliability Testing. The event series is hosted in cooperation with the ECPE e.V. – European Center for Power Electronics e.V. – and the Cluster of Power Electronics. It is held as an Online Conference. The next event takes place on the 10th of September from 9:00 am – 12:00 pm.

Key Topics

In 2020, the Power Semiconductor Reliability Round Table is dedicated to reliability testing of Wide-Bandgap Materials. The focus is on new challenges in qualification such as dynamic H3TRB, dynamic HTGB and dynamic RTGB testing.

Lifetime and reliability of Wide-Bandgap materials such as SiC are a cutting-edge topic. The new materials bring up completely new requirements, technology demands and test procedures which challenge the whole industry. The demand for dynamic H3TRB, HTGB and RTGB tests has risen extremely, but exact requirements are often hardly known yet.

Conference format

The event benefits from the involvement of the participants and the lively discussions – especially since it takes place online in 2020. The attendees of previous round tables jointly confirmed that the event on a small scope and the very open format offered the possibility for interactive technical discussions. Therefore we will continue this year with the combination of 10 minute presentations and about 15 minute discussions.

Become a speaker and share your challenges, requirements or solutions in a short presentation. SET will also share some insights of dynamic inhouse tests of new components.

We look forward to welcoming you!

Register here for the event

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Explanatory Notes