Power Semiconductor Reliability Round Table
March 14, 2023
International Power Semiconductor Reliability Round Table
The Power Semiconductor Reliability Round Table is our expert conference format regarding today’s and future challenges in Power Semiconductor Reliability Testing. The event series is hosted in cooperation with the ECPE e.V. – European Center for Power Electronics e.V. – and the Cluster of Power Electronics. It is held as an Online Conference. The next event takes place on the 14th of March 2023 from 3:00 pm – 6:00 pm (UTC+1).
Focus on Challenges in Wide Bandgap Qualification
In 2023, the Round Table will again be dedicated to reliability testing of wide bandgap materials. The focus is on new challenges in qualification of SiC and GaN such as dynamic H3TRB, dynamic HTGB and HTFB testing.
Lifetime and reliability of Wide-Bandgap materials are still a highly topical issue. The new materials always bring up new requirements, technology demands and test procedures which challenge the whole industry. The demand for dynamic H3TRB, HTGB and HTFB tests has increased strongly, but the exact test requirements have not yet been defined in a binding manner.
Conference format: Active participation
The event is free of charge, but it depends on the contributions of all participants – especially since it takes place online. That is why we ask you to share your experiences, challenges or findings at the Round Table. The attendees of previous round tables jointly confirmed that the event with its open format offered great added value for them. We will continue with the combination of 15 minute presentations and about 10 minute discussions.
„Do your part and share your challenges, requirements or solutions in a short presentation.“
We look forward to welcoming you!