12. Power Semiconductor Reliability Round Table

March 21, 2024

Online Conference

International Power Semiconductor Reliability Round Table

The Power Semiconductor Reliability Round Table is our expert conference format regarding today’s and future challenges in Power Semiconductor Reliability Testing. The event series is hosted in cooperation with the ECPE e.V. – European Center for Power Electronics e.V. – and the Cluster of Power Electronics. It is held as an Online Conference. The next event takes place on the 21st of March 2024 from 3:00 pm – 6:00 pm (UTC+1).

Focus on Challenges in Wide Bandgap Qualification

In 2024, the Round Table will again be dedicated to reliability testing of wide bandgap materials. The focus is on new challenges in qualification of SiC and GaN such as dynamic H3TRB, DRB, DGS, Power Cycling, and dynamic HTFB testing.

Lifetime and reliability of Wide-Bandgap materials are still a highly topical issue. The new materials always bring up new requirements, technology demands and test procedures which challenge the whole industry. The demand for dynamic tests has increased strongly, but the exact test requirements have not yet been defined in a binding standard.

Conference format: Active participation

The event is free of charge, but it depends on the contributions of all participants – either active participation or a short presentation. That is why we ask you to share your experiences, challenges or findings at the Round Table. We will have 15-minute presentations and about 10-minute discussions. You don’t have to present something every time, but it is important to us that all participants contribute from time to time.

Contribute to the success of the Round Table by joining in the discussion, contributing your experiences and ideas, and sometimes presenting something yourself. This event offers a platform that thrives on mutual exchange.

We look forward to welcoming you!

Register here (free of charge)