SET’s innovative test systems for power semiconductors at PCIM 2022
Visit our booth 6, in hall 410 during PCIM 2022 in Nuremberg to learn more about reliability tests using SET’s semiconductor test systems.
The semiconductor industry is going through fundamental change. In power electronics, the need for a more climate-friendly energy efficiency is becoming more and more predominant, i. a. by means of an all-encompassing electrification of our day-to-day lives. The growing application of power electronics in our environment – from e-mobility to wind turbines and from solar power to e-bikes – only increases the importance of precise reliability tests for power semiconductors.
SET is providing answers to the industry’s challenges and uses its testing capabilities to develop innovative solutions for power semiconductor tests in the forms of dynamic and static H3TRB / DRB / HTRB and HTGB / DGS as well as Power Cyling and IOL test systems. In addition to high DUT lot sizes per system, we also provide high-res data as a basis for analysis and consequently reduce the TCoT and the testing time at the same time. And you will also benefit from our long-standing experience in the semiconductor industry. Furthermore, we cooperate with academic institutions and use our membership in the European Center for Power Electronics e.V. (ECPE) to develop innovative semiconductor test systems that meet the newest requirements.
Visit our booth at PCIM 2022
This year, the fair will be held from 10-12 May 2022. The event site is the Nuremberg Exhibition Centre. Come look for us at the ECPE partnership booth in hall 6 at booth 410. We also look forward to welcoming you at the industry forum where Frank Heidemann, the general manager of SET GmbH, will give a keynote on “Challenges in Test & Qualification of Wide Bandgap Materials“: Wednesday, 11 May I 11:20 – 11:40 am I Fachforum, Fachforum, hall 6, booth 6-246
Insights taken from the keynote:
Lifetime and reliability of wide bandgap materials such as SiC and GaN are a highly topical issue. Certain failure patterns, which used to appear with silicon in static tests, show up with SiC only in novel dynamic test methods – and also completely new effects. Reliability test systems for these power electronics must therefore increasingly be able to cover dynamic tests as well. This leads to completely new requirements that challenge the entire industry.
Visit us at PCIM 2022 and find out more about our innovative semiconductor test systems. Make an appointment in advance – we look forward to personally exchanging with you!
About PCIM Europe
PCIM Europe Conference and international trade fair is a user-oriented platform with presentations covering all areas of power electronics.