Power electronics is deployed everywhere around us – from cars to wind power plants, from solar parks to e-bikes – therefore it is more important than ever to specify power semiconductor devices and explicitly test their reliability.

Our test systems (HTRB, H3TRB, HTOL, IOL, Power Cycling) pay off twice – They do not only offer a high number of DUT per system, they also provide high-resolution data for the process of analysis and therefore reduce TCoT while simultaneously reducing test time.

Visit us at PCIM 2017 (16th-18th May 2017, Nuremberg, Hall 7, Booth 237) to learn more about our innovative, fully automated semiconductor test systems.